Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs - Concepedia

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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs

DOI Full Paper Access

11

Citations

11

References

2019

Year

D. Boudier, B. Cretu, E. Simoen, Geert Hellings, T. Schram, Hans Mertens, D. Linten

Solid-State Electronics

Electrical EngineeringEngineeringPhysicsHigh-frequency DeviceElectronic EngineeringBias Temperature InstabilityApplied PhysicsNoiseSilicon On InsulatorMicroelectronics

References

	Year	Citations

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