IEEE Transactions on Electron Devices · 2019 · 15 citations · 23 references
EngineeringElectrical EngineeringMicroelectronicsNanotechnologySemiconductor DevicesCurrent-voltage CharacteristicsIntegrated Circuit DesignMems SwitchesMetal-oxide-semiconductor Field-effect TransistorsNanoelectromechanical SystemsNanoelectronicsBody BiasingConductanceHysteresisHysteresis PropertiesNanoelectronic DevicesPower ConsumptionPull-in VoltageSwitching Devices
This brief presents a fabricated and characterized 3-terminal (3T) nanoelectromechanical switch (NEMS) featuring for the first time a sub-50-mV pull-in voltage operation without body biasing. The proposed NEMS demonstrates a low hysteresis (<; 20 mV), low turn-on delay (15 ns), and record low subthreshold slope of 2 mV/decade due to the small air gap of only 100 nm between the gate and the source beam realized using a simple and low-cost fabrication process. NEMS is a propitious candidate toward ideal switch exhibiting a zero leakage with ON-state conductance of 0.1 A.V/μm and a sub-50-mV swing providing an ultralow active power consumption.
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A subthermionic tunnel field-effect transistor with an atomically thin channel
Deblina Sarkar, Xuejun Xie, Wei Liu et al. · Nature · 2015 · 964 citations