The Journal of Physical Chemistry C · 2019 · 23 citations · 29 references
Natural SciencesChemistryMaterials ScienceInterface ScienceSurface ChemistrySurface ScienceAtomic Force MicroscopyCoatingsInfrared SpectroscopyScanning Probe MicroscopySurface CharacterizationSurface PhysicsAluminum Oxide-organic InteractionsAtomic Force Microscopy AnalysisAtomic Force Microscopy Surface AnalysisExposed Interface AnalysisInfrared MicroscopyInterface CharacterizationPolymer CoatingsSpatial Resolution Analysis
Obtaining chemical information from the buried interface of an organic coating is not straightforward. In this paper, for the first time, atomic force microscopy-based infrared spectroscopy (AFM-IR) is used to probe the chemical interactions at the metal oxide/polymer interface. AFM-IR is a novel technique that provides chemical spectra with spatial resolution below the optical diffraction limits. Poly(acrylic acid) (PAA) on aluminum oxide was chosen as a model system. Two different approaches were used: a thin-layer approach and a cross-section approach. The thin layer confirmed the validity of the AFM-IR to look at the buried interface by comparison with results from the literature. Additionally, with a line scan, the exposed interfaces obtained from cross sections of thick coatings on aluminum substrates were analyzed. A semiquantitative analysis of the spectra from the line scan allowed to identify the chemical contribution coming from the polymer/metal oxide interfaces.
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