Materials Chemistry and Physics · 2019 · 21 citations · 36 references
Ii-vi SemiconductorCds/p-si HeterojunctionElectrical EngineeringEngineeringPhysicsApplied PhysicsCurrent-voltage CharacteristicsSemiconductor MaterialOptoelectronicsCompound SemiconductorSemiconductor Device
36
X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10K citations
Zhuwang Shao, Tiantian Zeng, Yinna He et al. · Chemical Engineering Journal · 2018 · 217 citations
Materials Science, Visible Light Irradiation, Engineering +10