Lattice strain mapping using circular Hough transform for electron diffraction disk detection

Electron Microscopy of Thin Crystals

Nature · 1963 · 4K citations

Natural Sciences, Materials Science, Physics +10

Quantitative measurement of displacement and strain fields from HREM micrographs

Martin Hÿtch, E. Snoeck, R. Kilaas · Ultramicroscopy · 1998 · 2.7K citations

Engineering, Biophysics, Materials Engineering +14

Electron microscopy of thin crystals

B.W. Cahn · Journal of Nuclear Materials · 1967 · 953 citations

Natural Sciences, Materials Science, Physics +10

Comparative study of Hough Transform methods for circle finding

H. K. Yuen, J. Princen, J. Illingworth et al. · Image and Vision Computing · 1990 · 770 citations

Computing, Computer Science, Mathematics +13

A 90-nm logic technology featuring strained-silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Transactions on Electron Devices · 2004 · 666 citations

Engineering, Electrical Engineering, Materials Science +17