Journal of Electronic Materials · 2019 · 23 citations · 27 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDielectricsIii-v SemiconductorsLeakage Power ReductionMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsThin-film TransistorsGate Dielectric EngineeringGate Oxide LeakageGate Stack EngineeringTunneling Field-effect TransistorsUltra-low-power Cmos
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Band-to-Band Tunneling in Carbon Nanotube Field-Effect Transistors
Joerg Appenzeller, Yu-Ming Lin, Joachim Knoch et al. · Physical Review Letters · 2004 · 880 citations