IEEE Transactions on Circuits and Systems I Regular Papers · 2019 · 21 citations · 25 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsMicrowave EngineeringAnalog InstrumentationAnalog Integrated CircuitsDigital Integrated CircuitsDigital Signal ProcessingMixed-signal Integrated Circuit DesignNoise In Analog CircuitsFeedbackFrequency-to-voltage ConversionPhase NoisePhase Noise AnalysisPhase Noise CompensationPhase-locked Loop DesignPhase-locked LoopsVoltage-to-frequency Conversion
This paper presents the first sampling ΔΣ fractional-N phase-locked loop (PLL) without a digital-to-time converter (DTC), whose design is challenging and requires complex calibration. A linear slope generator (LSG) is employed to generate a linear waveform, which has a large linear phase-to-voltage conversion range. Instead of modulating the reference signal by the DTC, phase dithering is performed at the feedback path through the combination of the LSG and a multi-modulus divider (MMDIV) with multi-phase generation. The reference signal then directly samples the linear LSG output waveform to output a sampled voltage corresponding linearly to the resulting phase error. All these enable the sampling phase detector to handle large phase dither step provided by a phase interpolator (PI), thus eliminating the need for the DTC and the associated calibration. This 2.2-GHz PLL achieves -246-dB FoM with an in-band phase noise of -110 dBc/Hz and -82-dBc reference spur while consuming only 3.2 mW in a 130-nm CMOS process.
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