Automated Defective Pin Detection for Recycled Microelectronics Identification

Very Deep Convolutional Networks for Large-Scale Image Recognition

Karen Simonyan, Andrew Zisserman · arXiv (Cornell University) · 2014 · 75.5K citations · Full text

Computing, Computer Science, Computer Vision +11

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Computing, Computer Science, Artificial Intelligence +15

Silhouettes: A graphical aid to the interpretation and validation of cluster analysis

Peter J. Rousseeuw · Journal of Computational and Applied Mathematics · 1987 · 20.7K citations

Computing, Visualization, Data Visualization +7

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Alec Radford, Luke Metz, Soumith Chintala · arXiv (Cornell University) · 2015 · 7K citations · Full text

Computing, Computer Science, Computer Vision +15

Support vector machines

Marti A. Hearst, Susan Dumais, E. Osuna et al. · IEEE Intelligent Systems and their Applications · 1998 · 6.9K citations

Computing, Computer Science, Machine Learning +14