Publication | Closed Access
Structural, Chemical and Electrical Properties of Au/La2O3/n-GaN MIS Junction with a High-k Lanthanum Oxide Insulating Layer
60
Citations
40
References
2019
Year
Materials EngineeringMaterials ScienceElectrical EngineeringAu/la2o3/n-gan Mis JunctionEngineeringNanoelectronicsApplied PhysicsAluminum Gallium NitrideGan Power DeviceGallium OxideElectrical Properties
| Year | Citations | |
|---|---|---|
Page 1
Page 1