Publication | Closed Access
Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
51
Citations
54
References
2019
Year
Materials ScienceMaterials EngineeringEngineeringMicrofabricationMicroscopyScanning Probe MicroscopyMechanical EngineeringApplied PhysicsStressstrain AnalysisMicroanalysisResidual StressNanometrologyMechanics Of MaterialsMicrostructure
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