Ultramicroscopy · 2018 · 11 citations · 26 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectromechanical SystemsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationMems CharacterizationMems DesignMems FabricationOptical MemsSemiconductor Device MaterialsSemiconductor CharacterizationSemiconductor Device CharacterizationSemiconductor Technology
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Atomically thin p–n junctions with van der Waals heterointerfaces
Chul‐Ho Lee, Gwan‐Hyoung Lee, Arend M. van der Zande et al. · Nature Nanotechnology · 2014 · 2.3K citations · Full text
Robust memristors based on layered two-dimensional materials
Miao Wang, Songhua Cai, Chen Pan et al. · Nature Electronics · 2018 · 782 citations · Full text
Enhanced photocatalytic performance of TiO2-ZnO hybrid nanostructures
Chun Cheng, Abbas Amini, Chao Zhu et al. · Scientific Reports · 2014 · 312 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17