Novel technique for measurement of coating layer thickness of fine and porous particles using focused ion beam - Concepedia

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Novel technique for measurement of coating layer thickness of fine and porous particles using focused ion beam

DOI Full Paper Access

15

Citations

16

References

2018

Year

M. Goslinska, Ilka Selmer, Christian Kleemann, Ulrich Kulozik, Stefan Heinrich

Materials ScienceLayer ThicknessEngineeringPorous ParticlesSurface ScienceApplied PhysicsIon BeamFocused Ion BeamDepth-graded Multilayer Coating

References

	Year	Citations

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