Concepedia

Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale

Richard Wirth

Chemical Geology · 2008 · 564 citations · 33 references

DOI

Concepts

References

33

<i>Electron Energy-Loss Spectroscopy in the Electron Microscope</i>

R.F. Egerton, Dale E. Newbury · Physics Today · 1987 · 3.4K citations

, , +11

The quantitative analysis of thin specimens

G. Cliff, G. W. Lorimer · Journal of Microscopy · 1975 · 1.8K citations

, , +16

Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy

Richard Wirth · European Journal of Mineralogy · 2004 · 438 citations

, , +9

Quantitative determination of iron oxidation states in minerals using Fe L 2,3 -edge electron energy-loss near-edge structure spectroscopy

Peter A. van Aken, B. Liebscher, Volker Josef Styrsa · Physics and Chemistry of Minerals · 1998 · 319 citations

, , +15

Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam

M.H.F. Overwijk, F.C. van den Heuvel, C. W. T. Bulle‐Lieuwma · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 258 citations

, , +12