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Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationThin FilmsCrystal EngineeringCrystal GrowthCrystallization ProcessesOptical Thin FilmsThin Film AnnealingThin-film DepositionAluminum Gallium NitrideAluminum NitrideAnnealingAnnealing Temperature EffectsAnnealing Time EffectsCrystal Quality ControlSapphire Substrate Preparation
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M. Asif Khan, M. Shatalov, H. P. Maruska et al. · Japanese Journal of Applied Physics · 2005 · 420 citations · Full text