Progress of the Scientific Commissioning of a fast neutron beamline for Chip Irradiation

Abstract

ChipIr is a new beamline at the ISIS spallation source dedicated to accelerated testing of microelectronics. ChipIr features an atmospheric-like neutron spectrum to study the so-called Single Event Effects, a major concern for the reliability of modern electronics at ground level and flight altitudes. A bespoke design was needed to extract a fast neutron beam from a neutron source designed for thermal neutron applications.