Towards bend-contour-free dislocation imaging via diffraction contrast STEM

EELS log‐ratio technique for specimen‐thickness measurement in the TEM

T. Malis, Shangcong Cheng, R.F. Egerton · Journal of Electron Microscopy Technique · 1988 · 881 citations

Engineering, Measurement, Microscopy +17

LXVIII. Direct observations of the arrangement and motion of dislocations in aluminium

P. B. Hirsch, R.W. Horne, M. J. Whelan · Philosophical magazine · 1956 · 461 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +16

IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE

J. M. Cowley · Applied Physics Letters · 1969 · 315 citations

Engineering, Electron Microscopy, Physics +13

Interference Effects in the Electron Microscopy of Thin Crystal Foils

W. Bollmann · Physical Review · 1956 · 238 citations

Materials Science, Electrolytic Polishing, Engineering +13

Diffraction contrast STEM of dislocations: Imaging and simulations

Patrick J. Phillips, M.C. Brandes, Michael J. Mills et al. · Ultramicroscopy · 2011 · 170 citations

Engineering, Dislocation Interaction, Physics +8