Dislocation Contrast Imaging
Dislocation Contrast Imaging is a materials characterization technique in semiconductor physics that exploits diffraction-based imaging modalities to selectively visualize crystallographic dislocations by their strain-induced contrast in crystalline lattices.
147
Publications
6.9K
Citations
394
Authors
162
Institutions
Publications per year
2017–2026
19
147
On diffraction contrast from inclusions
Michael F. Ashby, L. M. Brown · Philosophical magazine · 1963 · 329 citations
Natural Sciences, Materials Engineering, Materials Science +17
I. Gutiérrez‐Urrutia, Stefan Zaefferer, Dierk Raabe · Scripta Materialia · 2009 · 243 citations
Natural Sciences, Materials Engineering, Materials Science +17
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394
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162
University of Oxford
Oxford, United Kingdom
13 h-index
40 publications
1.3K citations

Centre National de la Recherche Scientifique
Paris, France
12 h-index
47 publications
1.5K citations
Max Planck Society
Munich, Germany
9 h-index
21 publications
3.4K citations
Stony Brook University
Stony Brook, United States
8 h-index
24 publications
931 citations
University of Cambridge
Cambridge, United Kingdom
7 h-index
18 publications
888 citations

Sorbonne Université
Paris, France
5 h-index
13 publications
318 citations
Kyushu University
Fukuoka, Japan
5 h-index
12 publications
269 citations
Nagoya University
Nagoya, Japan
5 h-index
26 publications
626 citations
1–8 of 162
16 publications · 780 citations
13
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15 publications · 366 citations
12
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13 publications · 492 citations
11
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12 publications · 669 citations
11
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9 publications · 273 citations
9
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1–5