Dislocation Contrast Imaging

Dislocation Contrast Imaging is a materials characterization technique in semiconductor physics that exploits diffraction-based imaging modalities to selectively visualize crystallographic dislocations by their strain-induced contrast in crystalline lattices.

147

Publications

6.9K

Citations

394

Authors

162

Institutions

Publications per year

2017–2026

19

Authors

394

  1. MD
    Michael Dudley

    Stony Brook University, United States

    8 publications · 302 citations

    8

    h-index

  2. BK
    B. K. Tanner

    Durham University, United Kingdom

    7 publications · 212 citations

    7

    h-index

  3. YE
    Y. Epelboin

    Centre National de la Recherche Scientifique, France

    5 publications · 147 citations

    5

    h-index

  4. AW
    A.J. Wilkinson

    University of Oxford, United Kingdom

    5 publications · 189 citations

    5

    h-index

  5. DR
    Dierk Raabe

    Max-Planck-Institut für Nachhaltige Materialien, Germany

    4 publications · 1.3K citations

    4

    h-index

1–5 of 394

Venues

  1. 13

    h-index

  2. physica status solidi (a)

    15 publications · 366 citations

    12

    h-index

  3. Applied Physics Letters

    13 publications · 492 citations

    11

    h-index

  4. Philosophical magazine

    12 publications · 669 citations

    11

    h-index

  5. Journal of Applied Crystallography

    9 publications · 273 citations

    9

    h-index

1–5