Materials Science in Semiconductor Processing · 2018 · 26 citations · 9 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationOptical MaterialsThin FilmsOptical Properties Of MaterialsOptical Properties Of SemiconductorsOptical Properties Of SolidsOptical Thin FilmsThin Film Optical PropertiesThin-film MaterialsOptical CharacterizationOptical ConstantsOptical Thin Film CharacterizationSemiconductor CharacterizationThickness-dependent Optical PropertiesThin-film Optical CharacterizationThin-film Transparency
9
Energy-Band Structure of Germanium and Silicon: The k·p Method
M. Cardona, Fred H. Pollak · Physical Review · 1966 · 644 citations
André S. Ferlauto, G.M. Ferreira, Joshua M. Pearce et al. · Journal of Applied Physics · 2002 · 542 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17