IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2018 · 46 citations · 15 references
ComputingComputer EngineeringComputer ScienceCryptographyHardware SecurityLow-power DesignCryptographic ArchitectureCryptographic ImplementationEmbedded SecuritySide-channel AnalysisSide-channel AttacksTiming AnalysisAdvanced Encryption StandardArea Overhead AnalysisEncryptionHardware Security ArchitecturePower Analysis CountermeasuresPower ConsumptionSide-channel Countermeasures
Power analysis attacks (PAAs), a class of side-channel attacks based on power consumption measurements, are a major concern in the protection of secret data stored in cryptographic devices. In this paper, we introduce the secure double rate registers (SDRRs) as a register-transfer level (RTL) countermeasure to increase the security of cryptographic devices against PAAs. We exploit the SDRR in a conventional advanced encryption standard (AES)-128 architecture, improving the immunity of the cryptographic hardware to the state-of-the-art PAAs. In the AES-128 exploiting SDRR, the combinational path evaluates random data throughout the entire clock cycle, and the interleaved processing of random and real data ensures the protection of both combinational and sequential logics. Our technique does not require the duplication of the combinational path to process the random data, thus limiting area overhead, unlike previous RTL countermeasures. The proposed approach is validated by means of PAAs based on real measurements on a field-programmable gate array implementation and on a 65-nm CMOS prototype chip. The protected implementation shows a strongly reduced correlation coefficient for the correct key, and more than three orders of magnitude increase in the measurements to disclosure with respect to the unprotected AES-128.
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Kris Tiri, Muhammad Akmal, Ingrid Verbauwhede · European Solid-State Circuits Conference · 2002 · 518 citations
Engineering, Computer Engineering, Electrical Engineering +17
A Survey of Lightweight-Cryptography Implementations
Thomas Eisenbarth, Sandeep Kumar, Christof Paar et al. · IEEE Design & Test of Computers · 2007 · 477 citations