Microelectronics Reliability · 2018 · 54 citations · 30 references
EngineeringElectrical EngineeringElectronic MaterialsPower ElectronicsSemiconductor DevicesConverter TopologiesDevice CharacterizationDevice ModelingDevice ReliabilitySemiconductor ReliabilityWide-bandgap Semiconductor DevicesAging CharacterizationAging Degradation AnalysisCarrier Lifetime MeasurementLifetime EstimationLifetime PredictionLifetimesReliability Analysis Of Power Electronics
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Thermal Stress and Low Cycle Fatigue
S. S. Manson, Thomas J. Dolan · Journal of Applied Mechanics · 1966 · 727 citations · Full text