Concepedia

Publication | Open Access

Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis

DOIFull Paper Access

73

Citations

42

References

2018

Year

Alexander M. Korsunsky, Enrico Salvati, Alexander J.G. Lunt, Tan Sui, Muhammad Zeeshan Mughal, R. Daniel, Jozef Kečkéš, Edoardo Bemporad, Marco Sebastiani
Materials & Design

References

YearCitations

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