R. Daniel

The origin of stresses in magnetron-sputtered thin films with zone T structures

R. Daniel, Klaus J. Martinschitz, Jozef Kečkéš et al. · Acta Materialia · 2010 · 187 citations

Materials Science, Magnetism, Engineering +9

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

Jozef Kečkéš, M. Bartosik, R. Daniel et al. · Scripta Materialia · 2012 · 117 citations

Materials Science, X-ray Nanodiffraction Reveals, Engineering +10

Grain boundary design of thin films: Using tilted brittle interfaces for multiple crack deflection toughening

R. Daniel, Michael Meindlhumer, Walter Baumegger et al. · Acta Materialia · 2016 · 112 citations

Materials Science, Brittle Interfaces, Engineering +14

Finite element simulation of the effect of surface roughness on nanoindentation of thin films with spherical indenters

C. Walter, Thomas Antretter, R. Daniel et al. · Surface and Coatings Technology · 2007 · 101 citations

Materials Science, Materials Engineering, Engineering +10

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Mario Stefenelli, Juraj Todt, A. Riedl et al. · Journal of Applied Crystallography · 2013 · 95 citations · Full text

Engineering, Mechanical Engineering, Residual Stress +21