Publication | Open Access
An analytical model for the detection of levitated nanoparticles in optomechanics
15
Citations
15
References
2018
Year
EngineeringMeasurementFeedback CoolingOptomechanical SystemInterferometryBiomedical EngineeringOptomechanicsInstrumentation EngineeringDetector PhysicsCalibrationNanometrologyLevitated ParticlesInstrumentationNanosensorNanomechanicsLevitated OptomechanicsAnalytical ModelPrecision MeasurementPhysicsNanotechnologyLevitated NanoparticlesInterferometric Position DetectionNanomaterialsNatural SciencesSpectroscopyInstrument ScienceApplied PhysicsOptical Trapping
Interferometric position detection of levitated particles is crucial for the centre-of-mass (CM) motion cooling and manipulation of levitated particles. In combination with balanced detection and feedback cooling, this system has provided picometer scale position sensitivity, zeptonewton force detection, and sub-millikelvin CM temperatures. In this article, we develop an analytical model of this detection system and compare its performance with experimental results allowing us to explain the presence of spurious frequencies in the spectra.
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