Publication | Closed Access
Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability
16
Citations
19
References
2018
Year
Electrical EngineeringEngineeringHardware ReliabilityBti ImpactBias Temperature InstabilityComputer EngineeringAdvanced Finfet DeviceCircuit ReliabilityDevice ReliabilityMicroelectronics
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