Electrostatically Tunable Adhesion in a High Speed Sliding Interface

Sukumar Rajauria, Oscar Ruiz-Salguero, Sripathi Vangipuram Canchi, Erhard Schreck, Qing Dai

Physical Review Letters · 2018 · 23 citations · 17 references

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Abstract

Contact hysteresis between sliding interfaces is a widely observed phenomenon from macro- to nanoscale sliding interfaces. Most such studies are done using an atomic force microscope (AFM) where the sliding speed is a few μm/s. Here, we present a unique study on stiction between the head-disk interface of commercially available hard disk drives, wherein the vertical clearance between the head and the disk is of the same order as in various AFM-based fundamental studies but with a sliding speed that is nearly 6 orders of magnitude higher. We demonstrate that, although the electrostatic force (dc or ac voltage) is an attractive force, the ac-voltage-induced out-of-plane oscillation of the head with respect to the disk is able to completely suppress the contact hysteresis.

References

17