Modeling and simulation of the charge trapping component of BTI and RTS - Concepedia

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Modeling and simulation of the charge trapping component of BTI and RTS

18

Citations

31

References

2017

Year

Thiago H. Both, Gabriela Firpo Furtado, Gilson Wirth

Microelectronics Reliability

Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronicsBias Temperature InstabilityApplied PhysicsCondensed Matter PhysicsCharge SeparationCharge Carrier TransportMicroelectronicsCharge Transport

References

	Year	Citations

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