Publication | Closed Access
FIB based fabrication of an operative Pt/HfO2/TiN device for resistive switching inside a transmission electron microscope
21
Citations
24
References
2017
Year
Materials ScienceEngineeringTunneling MicroscopyElectron MicroscopyElectron-beam LithographyNanoelectronicsNanotechnologyResistive SwitchingApplied PhysicsScanning Probe MicroscopyBeam LithographyOperative Pt/hfo2/tin DeviceMicroelectronicsTransmission Electron MicroscopeOptoelectronics
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