Journal of Instrumentation · 2017 · 35 citations · 1 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSensorsBuilt-in Self-testCmos Circuit DesignDevice CharacterizationPulse Processing ElectronicsTiming AnalysisAsic ImplementationCharge Collection ElectronicsDynamic RangeLow-power Design For TestabilityMemory Circuit DesignOn-chip InstrumentationPin Diodes
SKIROC2_CMS is a chip derived from CALICE SKIROC2 that provides 64 channels of low noise charge preamplifiers optimized for 50 pF pin diodes and 10 pC dynamic range. They are followed by high gain and low gain 25 ns shapers, a 13-deep 40 MHz analog memory used as a waveform sampler at 40 MHz. and 12-bit ADCs. A fast shaper followed by discriminator and TDC provide timing information to an accuracy of 50 ps, in order to test TOT and TOA techniques at system level and in test-beam. The chip was sent to fabrication in January 2016 in AMS SiGe 0,35 μm and was received in May. It was tested in the lab during the summer and will be mounted on sensors for beam-tests in the fall.
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Beam test performance of the SKIROC2 ASIC
Mohammad Sohail Amjad, M. Anduze, J.-E. Augustin et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2014 · 11 citations · Full text
Engineering, Aerospace Engineering, Mechanical Engineering +11