Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part II: Measurements and results - Concepedia

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Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part II: Measurements and results

15

Citations

10

References

2016

Year

D. Boudier, B. Cretu, Eddy Simoen, R. Carin, A. Veloso, Nadine Collaert, A. Thean

Solid-State Electronics

Electrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsNoiseMicroelectronicsPart Ii

References

	Year	Citations

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