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Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

DOI

27

Citations

16

References

2016

Year

D. Boudier, B. Cretu, Eddy Simoen, R. Carin, A. Veloso, Nadine Collaert, A. Thean
Solid-State Electronics

References

YearCitations

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