2003 · 35 citations · 8 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsOptoelectronicsSemiconductor DevicesCmos Circuit DesignDevice CharacterizationDevice ModelingIntegrated Circuit DesignOptical Properties Of SemiconductorsPhotonic Integrated CircuitsCircuit SimulationComplementary Metal-oxide-semiconductor SimulationHot Carrier EffectsMosfet ModelingNon-destructive InspectionOptical CharacterizationSemiconductor CharacterizationSemiconductor Device Characterization
An optical non-invasive inspection technique is presented. This tool is able to probe the electrical waveforms propagating through ULSI circuits, by means of hot-carrier luminescence. From the experimental results and the luminescence characterization, we propose a SPICE model able to foresee MOSFET emission and bulk current during circuit simulation.
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Avalanche photodiodes and quenching circuits for single-photon detection
S. Cova, Massimo Ghioni, Andrea L. Lacaita et al. · Applied Optics · 1996 · 1.1K citations
Threshold voltage model for deep-submicrometer MOSFETs
zhenglin liu, Chenming Hu, Jiawei Huang et al. · IEEE Transactions on Electron Devices · 1993 · 480 citations
Engineering, Electrical Engineering, Electronic Materials +16