Power cycle reliability of Cu nanoparticle joints with mismatched coefficients of thermal expansion

Toshitaka Ishizaki, Daiki Miura, A. Kuno, Raphael Nagao, Saiko Aoki, Y. Ohshima, Takao Kino, Masanori Usui, Yuri Yamada

Microelectronics Reliability · 2016 · 26 citations · 25 references

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