Effects of X-Ray Irradiation on the Channel Hot-Carrier Reliability of Thin-Oxide n-Channel MOSFETs - Concepedia

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Effects of X-Ray Irradiation on the Channel Hot-Carrier Reliability of Thin-Oxide n-Channel MOSFETs

13

Citations

0

References

1986

Year

J.Y.-C. Sun, José R. Maldonado, M. D. Rodríguez, J. Laskar, D.S. Zicherman

Unknown Venue

Channel Hot-carrier ReliabilityX-ray IrradiationEngineeringElectronic EngineeringBias Temperature InstabilityApplied PhysicsThin-oxide N-channel MosfetsDevice ReliabilityMicroelectronicsSemiconductor Device

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