Development of a shutterless calibration process for microbolometer-based infrared measurement systems

Abstract

To measure temperatures by microbolometer-based infrared cameras one has to deal with disturbing radiation flux due to the ambient temperature derived from the interior of the camera enclosure. The standard approach determines this radiation flux by using an optical shutter occasionally and subtracting the derived correction signal from the measurement signal. Omitting mechanical parts like the optical shutter might lead to more constructive freedom which is needed for advanced miniaturization. For that reason, a different compensation method and thus calibration process has to be developed. This paper proposes novel approaches to overcome the influences of changing ambient temperatures and discusses the conditions aiming for a new method.