Journal of Physics Condensed Matter · 2016 · 28 citations · 19 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials ChemistrySurface ScienceMemory DevicesNanoelectronicsNanostructured Electronic MaterialsRedox ChemistryRedox-active MaterialsSurface PhysicsCharge StorageCharge Storage MaterialsFlash MemoryFlash Memory DevicesMemory MaterialsNon-volatile MemoryNonvolatile Memory DevicesUltraviolet Photoelectron Spectroscopy
Reduction-oxidation (redox) active molecules hold potential for memory devices due to their many unique properties. We report the use of a novel diruthenium-based redox molecule incorporated into a non-volatile Flash-based memory device architecture. The memory capacitor device structure consists of a Pd/Al2O3/molecule/SiO2/Si structure. The bulky ruthenium redox molecule is attached to the surface by using a 'click' reaction and the monolayer structure is characterized by x-ray photoelectron spectroscopy to verify the Ru attachment and molecular density. The 'click' reaction is particularly advantageous for memory applications because of (1) ease of chemical design and synthesis, and (2) provides an additional spatial barrier between the oxide/silicon to the diruthenium molecule. Ultraviolet photoelectron spectroscopy data identified the energy of the electronic levels of the surface before and after surface modification. The molecular memory devices display an unsaturated charge storage window attributed to the intrinsic properties of the redox-active molecule. Our findings demonstrate the strengths and challenges with integrating molecular layers within solid-state devices, which will influence the future design of molecular memory devices.
19
Flash memory cells-an overview
Paolo Pavan, R. Bez, P. Olivo et al. · Proceedings of the IEEE · 1997 · 711 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
Flexible Organic Transistor Memory Devices
Soo‐Jin Kim, Jang‐Sik Lee · Nano Letters · 2010 · 391 citations
Natural Sciences, Materials Engineering, Materials Science +17
Eric Bersch, Sylvie Rangan, R. A. Bartynski et al. · Physical Review B · 2008 · 268 citations
Natural Sciences, Materials Engineering, Materials Science +14