Diffraction-grating characterization for cold-atom experiments

Abstract

We have studied the optical properties of gratings microfabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed the characterization of the diffraction efficiency as a function of the coating, periodicity, duty cycle, and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as the diffraction angle and wavelength, are also discussed, with an outlook to achieving optimal ultracold experimental conditions.