physica status solidi (b) · 2016 · 20 citations · 59 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistryPhysical ChemistryThin FilmsChemical Vapor DepositionMetal OxidesOxide SemiconductorsX-ray CrystallographyX-ray DiffractionX-ray Photoelectron SpectroscopyChemical Vapor Deposition MaterialsCrystallite Size AnalysisDiffraction AnalysisLattice EnergyN-type Oxide SemiconductorsNitride Thin FilmsTin OxidesX-ray Diffraction Analysis
The influence of nitrogen incorporation in high concentrations on the structural properties and morphology of SnO 2 –x N x thin films grown by chemical vapor deposition is studied. A decrease in crystallite size and a lattice expansion in SnO 2– x N x films with increasing x are found by X‐ray diffraction analysis and Raman spectroscopy. Substitutional nitrogen with a binding energy of 397.15 eV was detected by X‐ray photoelectron spectroscopy, attributed to the N 3 − ion in the SnN bond. The increase of the N atomic concentration x in SnO 2 –x N x films from 0 to 7.9 at.% without phase separation with increasing NH 3 flow rate during the deposition is accompanied by a decrease of O atomic concentration.
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Visible-Light Photocatalysis in Nitrogen-Doped Titanium Oxides
Ryoji Asahi, Takeshi Morikawa, Takeshi Ohwaki et al. · Science · 2001 · 12.2K citations