Publication | Closed Access
Assessment of 28 nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements
50
Citations
36
References
2015
Year
Electrical EngineeringRf ApplicationsEngineeringRadio FrequencyRf SemiconductorHigh-frequency DeviceNanoelectronicsAntennaParasitic ElementsElectronic PackagingMicroelectronicsMicrowave EngineeringRf SubsystemElectromagnetic Compatibility
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