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Investigation of the annealing effects on the structural and optoelectronic properties of RF-sputtered ZnO films studied by the Drude–Lorentz model

Materials ScienceSemiconductorsOptical MaterialsEngineeringOptoelectronic PropertiesOxide ElectronicsOptoelectronic MaterialsApplied PhysicsRf-sputtered Zno FilmsOptoelectronic DevicesThin Film Process TechnologyThin FilmsDrude–lorentz ModelOptoelectronicsThin Film ProcessingSemiconductor Nanostructures