FTIR and electrical characterization of a-Si:H layers deposited by PECVD at different boron ratios

Abdú Orduña-Díaz, C. G. Treviño-Palacios, Marlon Rojas‐López, R. Delgado‐Macuil, V. L. Gayou, Alfonso Torres

Materials Science and Engineering B · 2010 · 14 citations · 9 references

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