A comparison of run-to-run control algorithms

W.J. Campbell, Stacy Firth, Anthony J. Toprac, Thomas F. Edgar

2002 · 63 citations · 22 references

Concepts

Abstract

Run-to-run control is the term used for the application of batch process control as practiced in the semiconductor industry. This paper gives a brief introduction to the fundamental parts of a run-to-run control algorithm and surveys several of the popular techniques for the application of this control methodology. In particular, model predictive control is explored as a robust and flexible technique for implementing run-to-run control.

References

22