IEEE Microwave and Guided Wave Letters · 1993 · 125 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationMicrowave EngineeringDevice CharacterizationDielectric PropertiesDielectricsMicrowave MeasurementsMicrowave Transmission LinesTransmission LinesCoplanar WaveguidesDielectric CharacterizationDispersive MediaLossless Transmission LinesLossy Transmission LinesPlanar Microwave CircuitsTransmission Line AnalysisTransmission Line Losses
A method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics is introduced. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Comparison of On-Wafer Calibrations
Dylan F. Williams, Roger B. Marks, Andrew Davidson · 1991 · 224 citations