IEEE Photonics Technology Letters · 2005 · 20 citations · 6 references
Natural SciencesElectrical EngineeringPhysicsBiophotonicsOpticsPhotonicsElectro-optic EffectsInterferometryNear-field RegionsOptical WaveguidesPhysical OpticsBeam PropagationInterferenceNear-field Optical MicroscopyNear-field OpticsNear-field Scanning Optical MicroscopyScanning Near-field Optical MicroscopySingle-mode WaveguidesTransient Electromagnetic Interference
Near-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors.
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Near-field optical microscope using a silicon-nitride probe
N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman et al. · Applied Physics Letters · 1993 · 101 citations · Full text
Natural Sciences, Mechanical Engineering, Microfabrication +15