IEEE Electron Device Letters · 1995 · 14 citations · 3 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsHigh-frequency Semiconductor DevicesOptical Properties Of SemiconductorsOptoelectronic DevicesPhotodetectorsSemiconductor Device MaterialsSemiconductor PhysicsElectro-optic SamplingHigh-speed PhotodetectionImpulse ResponseImpulse Response MeasurementMetal-semiconductor-metal PhotodetectorsOptical SamplingPhotodiodesSubstitutional Doping
Very high-speed MSM photodiodes have been fabricated on Er-doped GaAs over a doping range of 10/sup 18/-10/sup 20/ cm/sup -3/. The impulse response (characterized by photoconductive sampling) of these diodes, with finger widths/spacings of 2 μm, has been found to be tunable over a range of about 3 ps-22 ps. Electro-optic sampling was used to characterize MSM diodes with finger widths/spacings of 0.5 μm and 1 μm on a sample with [Er]=10/sup 19/ cm/sup -3/, resulting in 3-dB bandwidths of 160 GHz and 140 GHz, respectively, corresponding to pulse widths of 2.7 ps and 3.3 ps. Correlation measurements were also done on the GaAs:Er samples, using an all-electronic Sampling Optical Temporal Analyzer (SOTA) structure.
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375-GHz-bandwidth photoconductive detector
Yi Chen, Steven L. Williamson, T. Brock et al. · Applied Physics Letters · 1991 · 143 citations · Full text
Engineering, Electrical Engineering, Electronic Materials +16