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Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes
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2002
Year
4H-sic Pin DiodesElectrical EngineeringCurrent-induced Stacking FaultsForward Voltage DegradationEngineeringPower DeviceBias Temperature InstabilityApplied PhysicsPower Semiconductor DeviceMicroelectronicsSemiconductor Device
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