Rapid simulation of substrate coupling effects in mixed-mode ICs

Abstract

Asymptotic waveform evaluation (AWE) techniques have been used to develop macromodels that allow accurate and efficient simulation of substrate-related parasitic electrical coupling effects using a modified version of SPICE3. While achieving comparable accuracy to a mixed device-circuit simulator (PISCES IIB), simulation time is reduced by several orders of magnitude. The macromodeling technique can be extended to simulate noise coupling in a VLSI chip, in contrast to conventional device-circuit simulators.