A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides - Concepedia

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A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides

33

Citations

2

References

1996

Year

R. Degraeve, P. Roussel, G. Groeseneken, H.E. Maes

Microelectronics Reliability

Electrical EngineeringEngineeringIntrinsic OxideOxide ElectronicsIntrinsic ImpurityApplied PhysicsTime-dependent Dielectric BreakdownNew Analytic ModelMicroelectronicsUltra-thin OxidesElectrical Insulation

References

	Year	Citations

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