EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesThermal AnalysisDevice CharacterizationDevice ModelingDevice ReliabilityIntegrated Circuit DesignSemiconductor ReliabilityThermal ManagementBreakdown VoltageHigh-temperature Device OperationThermal Effects In Integrated CircuitsThermal Management In High-frequency DevicesThermal Management Of Semiconductor DevicesThermal Safety AnalysisThermal-aware Physical DesignThermal-electrical Co-design
The boundaries that determine the Ldmos safe operating area are described and are shown to be predominantly thermal or electrical in origin. Methods of characterizing and analyzing the related thermal SOA and electrical SOA are illustrated. The impact on device size and related trade-offs with breakdown voltage and specific on-resistance are discussed, as are possibilities for improving SOA performance.
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Thermal properties of very fast transistors
R. Joy, E.S. Schlig · IEEE Transactions on Electron Devices · 1970 · 161 citations