IEEE Transactions on Electron Devices · 1995 · 38 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsMicrowave EngineeringSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationElectron TransportMicrowave Semiconductor DevicesSemiconductor PhysicsCharge Transport ModelingIonizationMicrowave ModelingPhysics-based Device ModelingPoisson EquationQuantum Mechanical ModelQuasi-two-dimensional ModelingSemiconductor Device Modeling
A new quasi-two-dimensional HEMT model has been developed that solves the physical device equations in a more rigorous fashion than previously reported. The model incorporates a quantum mechanical description of the free electron concentration, self-consistently solving the Schrodinger and Poisson equations. The influence of traps and incomplete donor ionization are also included. The conventional one-dimensional charge-control approach is shown to be inadequate for HEMT's and is replaced by a two-dimensional version that more accurately describes the channel dynamics under normal bias conditions. This allows the simulation to accurately model pinch-off characteristics, which are essential for digital, power and low-noise device characterization. The scheme also includes a detailed energy transport model, avalanche breakdown and gate conduction terms. The highly efficient model is applied to the DC and microwave characterization of AlGaAs-GaAs and pseudomorphic HEMT's.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
11
Introduction to Numerical Analysis.
Carl-Erik Fröberg, Josef Stoer, Roland Bulirsch · Mathematics of Computation · 1981 · 5.5K citations