Journal of Applied Physics · 1967 · 73 citations · 13 references
EngineeringMaterials ScienceSemiconductor DevicesSpectroscopyThermal AnalysisDevice CharacterizationTrap AnalysisElectroluminescenceGlow CurvesRecombination CentersTrap CharacterizationTrap States
For the determination of the trap depth from thermoluminescence and thermally stimuated current-glow curves commonly the initial-rise method by Garlick and Gibson is used. This method provides accurate results only if the condition Rh(T0)[2/z−1] ≤f(T0) is fulfilled. R is the retrapping factor, z the filling ratio of the traps at the temperature T0, f the concentration of unoccupied recombination centers, and h the density of trapped electrons.
13
Evaluation of Thermal Activation Energies from Glow Curves
A. Halperin, A. A. Braner · Physical Review · 1960 · 603 citations
Natural Sciences, Chemistry, Physics +14